Technical Program


SessionDevices, Characterization & Packaging 2
Date/Time25 May 2021 / 16:00 − 18:00 hrs
Session Chair/Co-ChairProf Jun Imaoka / Prof Sudarshan K.Valluru

Application of An Active Gate Driver for Paralleling Operation of Si IGBT and SiC MOSFET
Yuqi Wei, Xia Du, Dereje Woldegiorgis and Alan Mantooth

A Simple Transfer Capacitance Measurement Method of SiC MOSFET in High-voltage Applications
Huaqing Li, Chengzi Yang, Haoyuan Jin, Mengyu Zhu, Longyang Yu, Fengtao Yang, Shenghe Wang and Laili Wang

Research on Switching Characteristics of SiC MOSFET in Pulsed Power Supply with Analytical Model
Zaojun Ma, Yunqing Pei, Laili Wang, Qingshou Yang, Xiaohui Lu and Fengtao Yang

An Improved Drain-source Capacitance Characterization Method for SiC MOSFET Switching Performance Prediction
Huaqing Li, Chengzi Yang, Mengyu Zhu, Wei Mu, Shuting Feng, Shijie Wu, Laili Wang and Shenghe Wang

Design of Low Parasitic Inductance Three-level T-type SiC-MOS/Si-IGBT Module
Ye Wang, Min Chen and Dehong Xu